SEM-EM8100F
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SEM-EM8100F, Resolution 1nm@30kV(SE), Magnification 15x-800, 000x
It is the Upgrade version of EM8000, with upgraded E-Beam tube acceleration, varies vacuum mode, available to observe non-conducting sample at low voltage without sputtering, easy, convenient and friendly operation system, multiple extension remodel plan. It also the first FEG SEM which has the resolution at 1nm(30kV).
